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Thin layer drying characteristics of hulless oats at near amble t temperatures (Avena sativa l.)

Authors: R. Hulasare , D.S. Jayas. N.D.G. White and W.E. Muir
Description: A laboratory thin-layer drier was used to obtain the thin-layer drying and rewetting data for 70% hulless oats (Avena sativa L., cv. 'AC Belmont') using air at constant temperature and relative humidity conditions. The data were collected for various combinations ofinitial moisture content (II to 22% dry basis), temperature (I5 to 36°C), relative humidity (27 to 93%), and air velocity (0.05 to 0.97 m1s). Thin-layer drying and rewetting data were analyzed using liquid diffusion, Lewis', and Page's equations. The thin-layer drying and rewetting rates at constant relative humidities agreed well with Page's equation. The effects oftemperature, relative humidity, initial moisture content, and air velocity were characterized by parameters k and n of Page's equation. Temperature, relative humidity, and initial moisture content had significant effects (p > 0.05) on k. Relative humidity and initial moisture content had significant effects on parameter n. Air velocity did not have a significant effect (p > 0.05) on drying or rewetting. Due to their nonlinear distributions among the experimental tests, k and n could not be correlated with temperature and relative humidity for all the experimental tests.
Citation: R. Hulasare , D.S. Jayas. N.D.G. White and W.E. Muir 1999. TIDN LAYER DRYING CHARACTERJSTICS OF HULLESS OATS
AT NEAR AMBlE T TEMPERATURES (AVENA SATIVA L.). Canadian Agricultural Engineering 41(3):167-173.
Volume: 41
Issue: 3
Publisher: Canadian Society for Bioengineering
Date: 1999
Type: Text.Article
Format: PDF
Coverage: Canada
Language 1: en
Rights: Canadian Society for Bioengineering
Located in: Volume 41 (1999)